Login / Signup

A study of considering the reliability issues on ASIC/Memory integration by SIP (System-in-Package) technology.

Yong-Ha SongS. G. KimS. B. LeeK. J. RheeT. S. Kim
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • case study
  • data processing
  • empirical studies
  • integrated circuit
  • survey data
  • technical issues