A Very Fast Method for the DC Analysis of Diode-Transistor Circuits.
Michal TadeusiewiczAndrzej KuczynskiPublished in: Circuits Syst. Signal Process. (2013)
Keyphrases
- dynamic programming
- probabilistic model
- high precision
- segmentation method
- feature set
- high accuracy
- experimental evaluation
- computational cost
- signal analysis
- cost function
- pairwise
- data analysis
- significant improvement
- image processing
- prior knowledge
- low cost
- high speed
- statistical analysis
- support vector machine svm
- computational complexity
- mathematical model
- objective function
- bayesian networks