A novel impedance pattern for fast noise measurements.

M. De Dominicis Franco Giannini Ernesto Limiti Giovanni Saggio

Published in: IEEE Trans. Instrum. Meas. (2002)

Keyphrases

measurement noise
pattern matching
measurement errors
noise reduction
noise level
random noise
missing data
noise model
measurement error
additive noise
input data
low signal to noise ratio
noisy environments
image noise
arbitrary shape
measurement data
gaussian noise
low frequency
multiscale