IEEE P1581 can solve your board level memory cluster test problems.
Heiko EhrenbergPublished in: ITC (2007)
Keyphrases
- test problems
- branch and bound algorithm
- solution quality
- knapsack problem
- optimization problems
- benchmark problems
- tabu search
- test instances
- test functions
- memory requirements
- clustering algorithm
- higher level
- cost function
- multi objective optimization problems
- memory usage
- nsga ii
- hierarchical clustering
- data clustering
- simulated annealing
- high dimensional
- search algorithm