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Accumulator-based test-per-clock scheme for low-power on-chip application of test patterns.

Ioannis Voyiatzis
Published in: ETS (2014)
Keyphrases
  • low power
  • high speed
  • power consumption
  • low cost
  • single chip
  • cmos technology
  • video sequences
  • general purpose
  • hardware and software
  • vlsi implementation