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Interface traps effect on the charge transport mechanisms in metal oxide semiconductor structures based on silicon nanocrystals.

S. ChatbouriM. TroudiA. KalboussiA. Souifi
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • metal oxide semiconductor
  • low cost
  • integrated circuit
  • high speed
  • information systems
  • field effect transistors