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PaDiM: A Patch Distribution Modeling Framework for Anomaly Detection and Localization.

Thomas DefardAleksandr SetkovAngelique LoeschRomaric Audigier
Published in: ICPR Workshops (4) (2020)
Keyphrases
  • modeling framework
  • educational technology
  • topic modeling
  • image patches
  • machine learning
  • probability distribution
  • data mining
  • learning process