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PaDiM: A Patch Distribution Modeling Framework for Anomaly Detection and Localization.
Thomas Defard
Aleksandr Setkov
Angelique Loesch
Romaric Audigier
Published in:
ICPR Workshops (4) (2020)
Keyphrases
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modeling framework
educational technology
topic modeling
image patches
machine learning
probability distribution
data mining
learning process