Reliability Evaluation of the Count Min Sketch (CMS) against Single Event Transients (SETs).

Jinhua Zhu Zhen Gao Jie Jin Pedro Reviriego

Published in: VTS (2021)

Keyphrases

evaluation criteria
event detection
news articles
evaluation methods
event recognition
data mining
multiscale
information retrieval systems
logic programs
evaluation measures
gold standard
evaluation process
highly reliable