Characterization of Slow Traps in SiGe MOS Interfaces by TiN/Y2O3 Gate Stacks.

Tsung-En Lee Kasidit Toprasertpong Mitsuru Takenaka Shinichi Takagi

Published in: IRPS (2021)

Keyphrases

dual channel
artificial intelligence
image processing
interface design
thin film
real world
user interface
video sequences
nano scale
steady state
low cost
high resolution
data structure
multiscale
database systems
e learning
genetic algorithm