Investigation of Ga Contamination Due to Analysis by Dual Beam FIB.

Takahide Sakata Hideyuki Takahashi Tetsu Sekine Toshiya Ogiwara

Published in: Asian Test Symposium (1999)

Keyphrases

neural network
genetic algorithm
statistical analysis
genetic algorithm ga
artificial intelligence
artificial neural networks
multi objective
quantitative analysis
data sets
databases
case study
three dimensional
particle swarm optimization