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Tweaked binary tree algorithm to cope with capture effect and detection error in RFID systems.

Chuyen T. NguyenAnh Tuan H. BuiVuong V. MaiAnh T. Pham
Published in: APCC (2015)
Keyphrases
  • binary tree
  • similarity measure
  • object recognition
  • low cost
  • hierarchical structure
  • rfid systems
  • multiclass svm