A self-supervised learning framework based on masked autoencoder for complex wafer bin map classification.
Yi WangDong NiZhenyu HuangPuyang ChenPublished in: Expert Syst. Appl. (2024)
Keyphrases
- multi category
- supervised learning
- learning algorithm
- incremental learning
- kernel learning
- learning scheme
- learning process
- classification accuracy
- online learning
- dynamic bayesian networks
- real world
- design principles
- learning systems
- restricted boltzmann machine
- learning phase
- learning mechanism
- learning problems
- machine learning algorithms
- prior knowledge
- support vector
- machine learning
- learning tasks
- classification method
- support vector machine svm
- active learning
- pattern recognition