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A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing.

M. Amin SabetBehnam GhavamiMohsen Raji
Published in: IEEE Trans. Reliab. (2017)
Keyphrases
  • error tolerant
  • circuit design
  • graph matching
  • data model
  • closed form
  • neural network
  • optimal solution
  • subgraph isomorphism