The Associative Memory Model with Expecting Fault-Tolerant Field on Multi-Value Information Space.

Guowei Yang Shoujue Wang Xiaodong Zhuang

Published in: ICNSC (2008)

Keyphrases

associative memory
fault tolerant
bi directional
genetic algorithm
storage capacity
neural network
artificial neural networks
sensor data
neural network model
fault tolerance
high availability
kohonen feature map