An 8T eNVSRAM Macro in 22nm FDSOI Standard Logic with Simultaneous Full-Array Data Restore for Secure IoT Devices.
Sepideh NouriSubramanian S. IyerPublished in: ISSCC (2023)
Keyphrases
- data sets
- data collection
- data analysis
- high quality
- big data
- database
- original data
- prior knowledge
- data sources
- data mining techniques
- data processing
- statistical analysis
- raw data
- synthetic data
- storage devices
- training data
- data quality
- spatial data
- sensor data
- high dimensional data
- computer systems
- management system
- high dimensional
- database systems