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Fast Generation of Statistically-based Worst-Case Modeling of On-Chip Interconnect.

Norman ChangValery KanevskyO. Sam NakagawaKhalid RahmatSoo-Young Oh
Published in: ICCD (1997)
Keyphrases
  • worst case
  • high speed
  • low cost
  • lower bound
  • neural network
  • modeling method
  • analog vlsi
  • real time
  • data sets
  • image processing
  • evolutionary algorithm
  • np hard
  • upper bound
  • error bounds
  • average case
  • power dissipation