Evaluating substrate's effect on RF switch performance via Verilog-A GaN HEMT model.

Shubhankar Majumdar Dhrubes Biswas

Published in: Microelectron. J. (2017)

Keyphrases

image segmentation
statistical model
image processing
high level
formal model
neural network
multiscale
probabilistic model
computational model
theoretical framework
experimental data
prediction model
autoregressive