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Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model.

Young-Gu KimSang-Hoon LeeDae-Han KimJae-Woo ImSung-Eun YuDae-Wook KimYoung-Kwan ParkJeong-Taek Kong
Published in: ISQED (2006)
Keyphrases
  • statistical model
  • statistical models
  • three dimensional
  • least squares
  • graph cuts
  • statistical distribution