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Noise behavior of vertical tunnel FETs under the influence of interface trap states.
Vandana Devi Wangkheirakpam
Brinda Bhowmick
Puspa Devi Pukhrambam
Published in:
Microelectron. J. (2021)
Keyphrases
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personality traits
user friendly
noisy data
noise level
behavior patterns
noise reduction
human behavior
gaussian noise
interface design
random noise
state transitions
image noise
internal state
direct manipulation
low signal to noise ratio
behavior analysis
neural network
noise model
denoising
social networks