Near-field of a scanning aperture microwave probe: a 3-D finite element analysis.
Michael GolosovskyE. ManivDan DavidovA. FrenkelPublished in: IEEE Trans. Instrum. Meas. (2002)
Keyphrases
- finite element analysis
- phased array
- scan data
- finite element
- contact force
- single shot
- computer aided design
- finite element model
- friction coefficient
- structured light
- using artificial neural networks
- temperature field
- databases
- image processing
- material properties
- high resolution
- imaging systems
- mechanical properties
- optimization problems
- pattern recognition
- computer vision
- genetic algorithm
- real world