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Photon-Trapping Microstructure for InGaAs/Si Avalanche Photodiodes Operating at 1.31 μm.

Hewei ZhangYang TianQian LiWenqiang DingXuzhen YuZebiao LinXuyang FengYanli Zhao
Published in: Sensors (2022)
Keyphrases
  • monte carlo
  • mechanical properties
  • knowledge base
  • image processing
  • probabilistic model
  • x ray
  • learning rate