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Deep Semantic Feature Learning with Embedded Static Metrics for Software Defect Prediction.

Guisheng FanXuyang DiaoHuiqun YuKang YangLiqiong Chen
Published in: APSEC (2019)
Keyphrases
  • software defect prediction
  • learning process
  • learning algorithm
  • learning problems
  • active learning
  • semantic features
  • data mining
  • image classification
  • unsupervised learning
  • sample selection bias