Login / Signup
A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices.
Markus Leicht
G. Fritzer
B. Basnar
S. Golka
Jürgen Smoliner
Published in:
Microelectron. Reliab. (2001)
Keyphrases
</>
data analysis
image analysis
statistical analysis
high frequency
neural network
search algorithm
pattern recognition
low cost
low power