Dielectric function analysis of ZnSe and CdSe using parametric semiconductor model.
Yong Woo JungJae Jin YoonJun Seok ByunYoung Dong KimPublished in: Microelectron. J. (2008)
Keyphrases
- probabilistic model
- empirical data
- mathematical model
- computational model
- formal model
- probability distribution
- high level
- statistical model
- theoretical framework
- image analysis
- hidden markov models
- management system
- statistical analysis
- cost function
- artificial neural networks
- data analysis
- similarity measure
- information retrieval
- diffusion model