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On Benchmarking Pin Access for Nanotechnology Standard Cells.

Shang-Rong FangCheng-Wei TaiRung-Bin Lin
Published in: ISVLSI (2017)
Keyphrases
  • access control
  • remote access
  • real time
  • data sets
  • databases
  • neural network
  • learning algorithm
  • image segmentation
  • multiscale
  • information access
  • random access