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Deep Learning Approach for Optimal Localization Using an mm-Wave Sensor.

Bisma AmjadQasim Zeeshan AhmedPavlos I. LazaridisFaheem Ahmad KhanMaryam HafeezZaharias D. Zaharis
Published in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
  • deep learning
  • unsupervised feature learning
  • machine learning
  • unsupervised learning
  • localization error
  • image processing
  • image segmentation
  • high dimensional
  • mental models