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CNFET With Process Imperfection: Impact on Circuit-Level Yield and Device Optimization.
Kaship Sheikh
Shu-Jen Han
Lan Wei
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2016)
Keyphrases
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learning environment
optimization process
optimization problems
neural network
optimization algorithm
global optimization
real world
database
genetic algorithm
artificial intelligence
video sequences
artificial neural networks
process model
discrete optimization