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Comparison of decoupling resistors and capacitors for increasing the single event upset resistance of SRAM cells.
Zhong-Shan Zheng
Zhen-Tao Li
Ning Qiao
Kai Zhao
Fang Yu
Jia-Jun Luo
Published in:
ASICON (2015)
Keyphrases
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integrated circuit
artificial neural networks
input output
database
machine learning
learning algorithm
low cost
high speed
power consumption
event detection