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Comparison of decoupling resistors and capacitors for increasing the single event upset resistance of SRAM cells.

Zhong-Shan ZhengZhen-Tao LiNing QiaoKai ZhaoFang YuJia-Jun Luo
Published in: ASICON (2015)
Keyphrases
  • integrated circuit
  • artificial neural networks
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  • low cost
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  • power consumption
  • event detection