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"Quick-Scan" zur Abschätzung des Ladestationspotenzials in Nieder- und Mittelspannung.
Walter Schaffer
Gerald Hörack
Christoph Groiß
David Grubinger
Published in:
Elektrotech. Informationstechnik (2022)
Keyphrases
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scan data
real world
information retrieval
artificial intelligence
image processing
objective function
learning environment
high dimensional
multiresolution
management system
single scan