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Optimizing Dark Field Z-Scan for Third Order Optical Nonlinear Measurements in a Microscopic Configuration.

Mihaela ChisHongzhen WangChristophe CassagneCharles CiretGeorges Boudebs
Published in: ICTON (2018)
Keyphrases
  • optical properties
  • database
  • real time
  • feature selection
  • image sequences
  • support vector
  • closed loop
  • nonlinear equations
  • configuration problems