Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory.
Min YeQiao LiJianqiang NieTei-Wei KuoChun Jason XuePublished in: DATE (2020)
Keyphrases
- flash memory
- garbage collection
- solid state
- file system
- distance measure
- main memory
- embedded systems
- buffer management
- random access
- disk drives
- database systems
- b tree
- data storage
- storage systems
- small size
- hand held devices
- storage devices
- storage management
- similarity measure
- quality metrics
- sliding window
- memory management
- data management
- tree structure
- database management systems
- mobile devices
- data mining
- neural network
- data sets