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ICST 2008 Special Issue.

Robert M. HieronsAditya Mathur
Published in: Softw. Test. Verification Reliab. (2011)
Keyphrases
  • special issue
  • ai edam
  • ecml pkdd
  • international journal
  • applied intelligence
  • special section
  • expert systems
  • control system
  • data mining
  • information processing
  • recent advances
  • future directions