Login / Signup
TPMScan: A wide-scale study of security-relevant properties of TPM 2.0 chips.
Petr Svenda
Antonin Dufka
Milan Broz
Roman Lacko
Tomas Jaros
Daniel Zatovic
Josef Pospisil
Published in:
IACR Trans. Cryptogr. Hardw. Embed. Syst. (2024)
Keyphrases
</>
wide range
database
database systems
experimental study
information security
empirical studies
theoretical framework
structural properties
hong kong