Reliability model of bond wire fatigue for IGBT in MMC with system redundancy consideration.
Tao ZhengMeng HuangYi LiuXiaoming ZhaPublished in: Microelectron. Reliab. (2018)
Keyphrases
- probabilistic model
- computational model
- formal model
- neural network
- prediction model
- statistical model
- probability distribution
- multi class
- network model
- mathematical model
- process model
- theoretical framework
- markov chain
- least squares
- real time
- support vector machine
- multi agent
- objective function
- high level
- knowledge base
- data mining
- data sets