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Addressing Unreliability in Emerging Devices and Non-von Neumann Architectures Using Coded Computing.
Sanghamitra Dutta
Haewon Jeong
Yaoqing Yang
Viveck R. Cadambe
Tze Meng Low
Pulkit Grover
Published in:
Proc. IEEE (2020)
Keyphrases
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von neumann
expected utility
mobile devices
neural network
data mining
probability distribution
optimization problems
robust optimization