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Addressing Unreliability in Emerging Devices and Non-von Neumann Architectures Using Coded Computing.

Sanghamitra DuttaHaewon JeongYaoqing YangViveck R. CadambeTze Meng LowPulkit Grover
Published in: Proc. IEEE (2020)
Keyphrases
  • von neumann
  • expected utility
  • mobile devices
  • neural network
  • data mining
  • probability distribution
  • optimization problems
  • robust optimization