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Special Issue on the 2017 IEEE International Instrumentation and Measurement Technology Conference.
Sergio Rapuano
Sebastian Yuri Cavalcanti Catunda
Wuqiang Yang
Published in:
IEEE Trans. Instrum. Meas. (2018)
Keyphrases
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special issue
international journal
ai edam
ecml pkdd
applied intelligence
case study
special section
computer society
selected papers
san diego
san diego supercomputer center
computer science
mobile devices
invited talk
advanced technologies