Login / Signup
Statistical Run-Time Verification of Analog Circuits in Presence of Noise and Process Variation.
Rajeev Narayanan
Ibtissem Seghaier
Mohamed H. Zaki
Sofiène Tahar
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
</>
analog circuits
neural network
pattern recognition
design process
model checking
statistical models
noisy data