Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing.

Xiaoqiang Liu Li Cai Baojun Liu Xiaokuo Yang Huanqing Cui Cheng Li

Published in: IEEE Access (2019)

Keyphrases

silicon on insulator
human body
numerical simulations
neural network
action selection
data sets
reinforcement learning
finite element method