Login / Signup
Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing.
Xiaoqiang Liu
Li Cai
Baojun Liu
Xiaokuo Yang
Huanqing Cui
Cheng Li
Published in:
IEEE Access (2019)
Keyphrases
</>
silicon on insulator
human body
numerical simulations
neural network
action selection
data sets
reinforcement learning
finite element method