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Progressive Degradation Without Physical Failure During Mounting Due to Soft Overstress in Compound HBT for RF, Mobile, and Automotive Applications.

Hyeokjae LeeSanggi KoHo-Joon SuhGina JeongJung-Han YeoHye-Min ParkHee-Kyeong KimJong-Kwan KimSung S. ChungYoungboo KimJisun ParkHyungsoon Shin
Published in: IRPS (2022)
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