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Detecting Common Errors in Event-Driven Process Chains by Label Analysis.

Volker GruhnRalf Laue
Published in: Enterp. Model. Inf. Syst. Archit. Int. J. Concept. Model. (2011)
Keyphrases
  • event driven
  • image segmentation
  • high level
  • data analysis
  • pairwise
  • error analysis
  • neural network
  • training set
  • sensor networks
  • statistical analysis
  • process model
  • quantitative analysis
  • information delivery