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A novel gate grading approach for soft error tolerance in combinational circuits.

Mohammad Saeed AnsariAli MahaniJie HanBruce F. Cockburn
Published in: CCECE (2016)
Keyphrases
  • error tolerance
  • logic circuits
  • cmos technology
  • asynchronous circuits
  • low power
  • high speed
  • power consumption
  • digital curves
  • power dissipation
  • field effect transistors
  • wavelet transform
  • sample size
  • low voltage