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W2S: Microscopy Data with Joint Denoising and Super-Resolution for Widefield to SIM Mapping.
Ruofan Zhou
Majed El Helou
Daniel Sage
Thierry Laroche
Arne Seitz
Sabine Süsstrunk
Published in:
ECCV Workshops (1) (2020)
Keyphrases
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super resolution
denoising
high resolution
low resolution
high quality
feature vectors
resolution enhancement
computer vision
image analysis
optical flow
image data
markov random field
image reconstruction