All-Digital-Very-Scalable-ADC TAD Showing Scaling-Effect in 40/16nm-CMOS Technology.

Takamoto Watanabe

Published in: ICECS (2018)

Keyphrases

cmos technology
mixed signal
low power
power consumption
analog to digital converter
spl times
parallel processing
low voltage
image sensor
single chip
cmos image sensor
high speed
power dissipation
low cost
silicon on insulator
multi channel
sigma delta
image analysis
pattern recognition