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Static Noise Margin and Soft-Error Rate Simulations for Thin Film Transistor Cell Stability in a 4 Mbit SRAM Design.

Mankoo LeeWing-Il SzeChii-ming M. Wu
Published in: ISCAS (1995)
Keyphrases
  • error rate
  • test set
  • signal to noise ratio
  • training error
  • pattern recognition
  • feature space
  • misclassification rate
  • expected loss