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Static Noise Margin and Soft-Error Rate Simulations for Thin Film Transistor Cell Stability in a 4 Mbit SRAM Design.
Mankoo Lee
Wing-Il Sze
Chii-ming M. Wu
Published in:
ISCAS (1995)
Keyphrases
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error rate
test set
signal to noise ratio
training error
pattern recognition
feature space
misclassification rate
expected loss