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A New Device for In Situ Measurement of an Impedance Profile at 1-20 MHz.

Xavier ChavanneJean-Pierre FrangiGilles de Rosny
Published in: IEEE Trans. Instrum. Meas. (2010)
Keyphrases
  • data acquisition
  • measurement data
  • high speed
  • neural network
  • user profiles
  • learning environment
  • high frequency
  • electronic devices
  • portable devices