A survey of cross-layer power-reliability tradeoffs in multi and many core systems-on-chip.
Ahmed M. EltawilMichael EngelBibiche M. GeuskensAmin Khajeh DjahromiFadi J. KurdahiPeter MarwedelSmaïl NiarMazen A. R. SaghirPublished in: Microprocess. Microsystems (2013)