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Comprehensive Analysis of Generated Single Event Transients in Most Common Logic Cells of Skywater's 130-nm Technology.

Janani AravindVictor OyadonghaDaniel B. Limbrick
Published in: ACM Great Lakes Symposium on VLSI (2024)
Keyphrases
  • comprehensive analysis
  • multimedia content analysis
  • nm technology
  • real time
  • news articles
  • automatically generated
  • multi valued
  • knowledge base
  • case study
  • logic programming
  • event detection