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Automatic detection of artifacts in EEG by combining deep learning and histogram contour processing.
Nooshin Bahador
Kristo Erikson
Jouko Laurila
Juha Koskenkari
Tero Ala-Kokko
Jukka Kortelainen
Published in:
EMBC (2020)
Keyphrases
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automatic detection
deep learning
machine learning
unsupervised learning
automatically detecting
unsupervised feature learning
information extraction
active contours
mental models
deep architectures
face recognition
pattern recognition