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Batch Mode Active Learning with Hierarchical-Structured Embedded Variance.

Yu ChengZhengzhang ChenHongliang FeiFei WangAlok N. Choudhary
Published in: SDM (2014)
Keyphrases
  • batch mode active learning
  • active learning
  • batch mode
  • embedded systems
  • max margin learning
  • machine learning
  • data sets
  • feature extraction
  • image retrieval
  • computational complexity
  • hierarchical structure