Login / Signup

Delay/Power Modeling and Optimization of FinFET Circuit Modules under PVT Variations: Observing the Trends between the 22nm and 14nm Technology Nodes.

Aoxiang TangXun GaoLung-Yen ChenNiraj K. Jha
Published in: ACM J. Emerg. Technol. Comput. Syst. (2016)
Keyphrases